Ioannis Georgakilas, Darius Urbonas, et al.
SPS Annual Meeting 2022
We demonstrate the integration of single-crystalline barium titanate thin films on silicon substrates, with Pockels coefficients of rEff ~ 148 pm/V. We further show the implementation of such layers into silicon photonic devices such as ring resonators. © OSA 2013.
Ioannis Georgakilas, Darius Urbonas, et al.
SPS Annual Meeting 2022
A. Borzì, S. Dolabella, et al.
Materialia
Éamon O'Connor, Mattia Halter, et al.
APL Materials
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SPIE IOPTO 2008