Nanoscale resistive memory device using SrTiO3 films
S. Karg, G.I. Meijer, et al.
NVSMW 2007
The charge transport of polycrystalline SrTiO3 films doped with Cr is investigated by means of temperature- and electric-field-dependent current measurements. In particular, the effect of electrical stress on the conduction mechanism is analyzed to understand the forming process of samples exhibiting resistance-switching phenomena. The temperature dependence of the conductivity can be described with the variable-range hopping model. The electrical-stress- induced conductivity increase of SrTiO3 films is accompanied by a change of the temperature dependence corresponding to a significant increase of the density of localized states. © 2006 American Institute of Physics.
S. Karg, G.I. Meijer, et al.
NVSMW 2007
S.A. Carter, Marie Angelopoulos, et al.
Applied Physics Letters
H. Riel, S. Barth, et al.
Proceedings of SPIE - The International Society for Optical Engineering
B.P. Andreasson, M. Janousch, et al.
Applied Physics Letters