Dynamic coercivity measurements in thin film recording media using a contact write/read tester

The dynamic coercivity of magnetic thin film recording media was measured using a nanoresolution contact write/read test apparatus. The time dependence of the remanent coercivity over more than 10 orders of magnitude was measured by exposing the dc-magnetized films to different reversed magnetic field pulses. The results of the remanence coercivity and signal decay measurement of the CoPtCr recording media are discussed.