Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
K.A. Chao
Physical Review B
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007