Modeling of dislocations in an epitaxial island structure
X.-H. Liu, F.M. Ross, et al.
MRS Proceedings 2001
Dislocation dynamics simulations have been used to study the stress-strain response of single-crystal micropillars containing initial dislocation networks generated via a relaxation procedure intended to approximate real thermal annealing processes. We find that, when such networks are loaded, they exhibit periods of plastic deformation, caused by the operation of single junction-stabilized spiral sources, followed by intervals of purely elastic straining when the sources shut down. The results provide insight into the mechanisms responsible for the experimentally observed staircase stress-strain behavior. © 2008 The American Physical Society.
X.-H. Liu, F.M. Ross, et al.
MRS Proceedings 2001
J.B. Hannon, V.B. Shenoy, et al.
Science
H. Tang, K.W. Schwarz, et al.
Acta Materialia
K.W. Schwarz
Physical Review Letters