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PaperSurface diffractometry and lattice imaging of scanning tunneling microscopy imagesJ.E. Demuth, R.J. Hamers, et al.Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperEffects of coverage on the geometry and electronic structure of Al overlayers on Si(111)R.J. HamersPhysical Review B
PaperSurface reconstruction and the nucleation of palladium silicide on Si(111)U.K. Köhler, J.E. Demuth, et al.Physical Review Letters
