Sung Ho Kim, Oun-Ho Park, et al.
Small
Long wavelength interface optical phonons measured by HREELS are used to characterize interfaces between different dielectric materials. Four cases are presented: (1) a diffuse interface SiO2Si(100); (2) an epitaxial abrupt interface: CaF2Si(111); (3) an epitaxial reactive interface: AlSbSb(111); (4) an epitaxial periodic interface in a GaAsAlGaAs superlattice. Complementary information about the chemical structure of the first three interfaces is given by synchrotron radiation induced photoemission. © 1990.
Sung Ho Kim, Oun-Ho Park, et al.
Small
Kigook Song, Robert D. Miller, et al.
Macromolecules
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry