PublicationIEEE International SOI Conference 2005Conference paperDevelopment of stacking faults in strained silicon layersIEEE International SOI Conference 2005View publicationAbstractNo abstract available.Home↳ PublicationsDate01 Dec 2005PublicationIEEE International SOI Conference 2005AuthorsS.W. BedellA. ReznicekB.F. YangH.J. HovelJ.A. OttK.E. FogelA. DomenicucciD.K. SadanaIBM-affiliated at time of publicationShare