Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
We study feature selection for k-means clustering. Although the literature contains many methods with good empirical performance, algorithms with provable theoretical behavior have only recently been developed. Unfortunately, these algorithms are randomized and fail with, say, a constant probability. We present the first deterministic feature selection algorithm for k-means clustering with relative error guarantees. At the heart of our algorithm lies a deterministic method for decompositions of the identity and a structural result which quantifies some of the tradeoffs in dimensionality reduction. © 1963-2012 IEEE.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Bowen Zhou, Bing Xiang, et al.
SSST 2008
Michael C. McCord, Violetta Cavalli-Sforza
ACL 2007