Conference paper
Full copper wiring in a sub-0.25 μm CMOS ULSI technology
D. Edelstein, J. Heidenreich, et al.
IEDM 1997
This paper presents an optimized partially-depleted SOI device design for the 0.18 μm CMOS technology generation and addresses several SOI unique floating-body effect issues which can affect the design. It is demonstrated that through proper device optimization, these undesired SOI-specific issues can be minimized to improve the manufacturability while maintaining high performance. Inverter delays of 5.1/4.7 ps at 1.5/1.8 V are achieved at low temperature. At room temperature, a delay of 12 ps is achieved at only 0.8 V supply voltage.
D. Edelstein, J. Heidenreich, et al.
IEDM 1997
N. Zamdmer, J.O. Plouchart, et al.
ESSDERC 2002
S.K.H. Fung, L. Wagner, et al.
VLSI Technology 2000
J.O. Plouchart, Jonghae Kim, et al.
ISLPED 2003