D.J. DiMaria, D.R. Young, et al.
Journal of Applied Physics
Conference paper
Degradation of thin SiO 2 gate oxides by atomic hydrogen
Abstract
No abstract available.
Related
D.J. DiMaria, Z.A. Weinberg, et al.
Journal of Applied Physics
Conference paper
High transconductance 0.1 μ m pMOSFET
Y. Taur, S. Cohen, et al.
IEDM 1992
A.C. Callegari, P.D. Hoh, et al.
Applied Physics Letters