Publication
Advances in Semiconductors and Semiconductor Structures 1987
Conference paper

Cross-talk and transit-time effects in stroboscopic voltage measurements via electron emission

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Abstract

The dependence on geometry, extraction field, electron start energy, and rise time of the input signal is investigated for the transit-time and cross-talk effects in stroboscopic voltage measurements via electron emission. The investigation yields information about the best achievable time resolution and the disturbance of measured signals by signals on neighboring conductors in corresponding contactless voltage-measuring techniques like photoemission sampling and electron-beam sampling.