J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
Paper
Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry
Abstract
No abstract available.
Related
R.W. Gammon, E. Courtens, et al.
Physical Review B
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Kigook Song, Robert D. Miller, et al.
Macromolecules