R.H. Geiss, T.C. Huang
X‐Ray Spectrometry
X-ray diffraction was used to investigate the effect of nitrogen additions on the crystal structure and preferred orientation of FeMn films reactively sputtered in an Ar-N2 ambient. The fcc γ-FeMn phase was stabilized over a range of nitrogen pressures. The fcc FeMn(N) film was then used as a nucleation substrate for the deposition of an FeMn/Permalloy exchange coupled structure. A maximum exchange bias of 60-70 Oe was obtained when the FeMn(N) film was lattice matched to the γ-FeMn structure (a 0=3.63 Å).
R.H. Geiss, T.C. Huang
X‐Ray Spectrometry
S.S.P. Parkin, V.Y. Lee, et al.
Physical Review B
T.C. Huang, H. Toraya, et al.
Journal of Applied Crystallography
M.H. Tabacniks, A.J. Kellock, et al.
MRS Spring Meeting 1995