Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
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PaperCharacterization of large magnetic anisotropies in (100)- and (111)-oriented Co/Pt multilayers by Brillouin light scatteringJ.V. Harzer, B. Hillebrands, et al.Journal of Magnetism and Magnetic Materials
TalkDirect electrical access to the spin manifolds of individual lanthanide atomsGregory Czap, Kyungju Noh, et al.APS Global Physics Summit 2025