Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
Conference paperIntegration of polymer self-assembly for lithographic applicationJoy Y. Cheng, Daniel P. Sanders, et al.SPIE Advanced Lithography 2008
PaperCharacterization of large magnetic anisotropies in (100)- and (111)-oriented Co/Pt multilayers by Brillouin light scatteringJ.V. Harzer, B. Hillebrands, et al.Journal of Magnetism and Magnetic Materials
TalkDirect electrical access to the spin manifolds of individual lanthanide atomsGregory Czap, Kyungju Noh, et al.APS Global Physics Summit 2025
