Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
This paper provides a brief overview of the use of EXAFS in investigating atomic arrangements in amorphous alloys. Comparisons are drawn between EXAFS and scattering techniques, in terms of equations used to analyze the two types of measurements and in terms of results for specific amorphous alloys. Both the promises and the problems of EXAFS for amorphous alloys are discussed. © 1984.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films