Conference paperChanges of Tc under epitaxial strain: Implications for the mechanism of superconductivityJ.P. Locquet, J. Perret, et al.SPIE Optical Science, Engineering, and Instrumentation 1998
Conference paperLithographic characteristics of 193-nm resists imaged at 193 and 248 nmJuliann Opitz, Robert D. Allen, et al.Microlithography 1998
PaperDynamic graph and polynomial chaos based models for contact tracing data analysis and optimal testing prescriptionShashanka Ubaru, Lior Horesh, et al.Journal of Biomedical Informatics
Conference paperA reinforcement learning approach to production planning in the fabrication/fulfillment manufacturing processHeng Cao, Haifeng Xi, et al.WSC 2003
