Benchmarking the PSP compact model for MOS transistors

Abstract

Recently, the PSP model was selected as the first surface-potential-based industry standard compact MOSFET model. This work presents the results of several qualitative "benchmark" tests that over the last two years were used to verify the physical behavior of the new model and its usefulness for future generations of CMOS IC design. These include newly developed tests and previously unavailable experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs. © 2007 IEEE.