P.S. Hauge, R.H. Muller, et al.
Surface Science
The application of rotating-compensator ellipsometry (RCE) to measurements of the system Mueller matrix M of linear optical systems is reported. This technique extends a previously reported procedure for automated Jones matrix ellipsometry to include systems that depolarize light. © 1976.
P.S. Hauge, R.H. Muller, et al.
Surface Science
P.S. Hauge
Proceedings of SPIE 1989
P.S. Hauge
Surface Science
E.P. Harris, P.S. Hauge, et al.
Applied Physics Letters