Atomic-force microscopy

G. Binnig

doi:10.1088/0031-8949/1987/T19A/008

Physica Scripta

Paper

14 Feb 2007

Atomic-force microscopy

View publication

Abstract

Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.

Paper

Synthesis of 1,2,4-Triazole Poly(aryl ethers) via Heterocyclic-Activated Displacement Polymerization

Kenneth R. Carter, Robert D. Miller, et al.

Macromolecules

Paper

Theory of temperature-induced Mott transitions

Ellen J. Yoffa, David Adler

Physical Review B

Paper

Picosecond spin dynamics in dilute magnetic systems

D.D. Awschalom, J.-M. Halbout

Journal of Magnetism and Magnetic Materials

Conference paper

Formation mechanism and suppression methods of copper dendrites in BEOL integration

Shaoning Yao, Wei-Tsu Tseng, et al.

ADMETA 2011

View all publications

Abstract

Related

Synthesis of 1,2,4-Triazole Poly(aryl ethers) via Heterocyclic-Activated Displacement Polymerization

Theory of temperature-induced Mott transitions

Picosecond spin dynamics in dilute magnetic systems

Formation mechanism and suppression methods of copper dendrites in BEOL integration