Areal density process advantages for CPP sensors

Abstract

The areal density process advantages for CPP sensors are discussed. The CPP sensor geometry removes the CIP sensor processing requirement for thin insulating gaps and allows for precise confinement of current flow and hence magnetic trakwidth control. Results shows that due to the processing advantages, CPP sensors are a viable approach for producing 200 Gbit/in2 to 400 Gbit/in2 shielded sensors.