J.A. Barker, D. Henderson, et al.
Molecular Physics
We have observed an anomalous coverage dependence of sputtered Cs+ and Li+ yields from Cs and Li overlayers on Si(111) surfaces. The ion yield reaches a maximum and decreases at higher coverages even when the coverage is still less than a monolayer. We found that this phenomenon is directly related to the effect of the work function on the ionization probability. © 1984 The American Physical Society.
J.A. Barker, D. Henderson, et al.
Molecular Physics
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997