Conference paper
Performance test case generation for microprocessors
Pradip Bose
VTS 1998
Statistical experiments have been performed on the photostore to test its reliability as a mass storage system. Errors are analyzed with respect to rate, distribution, and susceptibility to correction by several codes. The experimental results reported are based on disks recorded by optical techniques. Experimental results on disks recorded with electron beams win be reported separately. Copyright © 1968 by The Institute of Electrical and Electronic Engineering, Inc.
Pradip Bose
VTS 1998
S. Sattanathan, N.C. Narendra, et al.
CONTEXT 2005
Elliot Linzer, M. Vetterli
Computing
B.K. Boguraev, Mary S. Neff
HICSS 2000