Bowen Zhou, Bing Xiang, et al.
SSST 2008
Statistical experiments have been performed on the photostore to test its reliability as a mass storage system. Errors are analyzed with respect to rate, distribution, and susceptibility to correction by several codes. The experimental results reported are based on disks recorded by optical techniques. Experimental results on disks recorded with electron beams win be reported separately. Copyright © 1968 by The Institute of Electrical and Electronic Engineering, Inc.
Bowen Zhou, Bing Xiang, et al.
SSST 2008
Rajiv Ramaswami, Kumar N. Sivarajan
IEEE/ACM Transactions on Networking
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Arun Viswanathan, Nancy Feldman, et al.
IEEE Communications Magazine