True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
The domain structures of palladium and Pd2Si as well as their crystallographic relationship to the silicon substrates were determined on Si(111) and Si(100) samples by mapping X-ray diffraction pole figures. X-ray diffraction topography and rocking curve measurements were carried out for the silicon substrates in order to detect the presence of elastic and/or plastic deformation in the substrates caused by silicide formation. The stresses in the silicide films were determined from the bending of the silicon substrates using X-ray diffraction techniques. © 1982.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter