Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The domain structures of palladium and Pd2Si as well as their crystallographic relationship to the silicon substrates were determined on Si(111) and Si(100) samples by mapping X-ray diffraction pole figures. X-ray diffraction topography and rocking curve measurements were carried out for the silicon substrates in order to detect the presence of elastic and/or plastic deformation in the substrates caused by silicide formation. The stresses in the silicide films were determined from the bending of the silicon substrates using X-ray diffraction techniques. © 1982.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
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ACS Nano
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Active Matrix Liquid Crystal Displays Technology and Applications 1997