Conference paper
Experimental 27 ns 1 Mb CMOS high-speed DRAM
S. Dhong, W.H. Henkels, et al.
VLSI Circuits 1989
A technique for accurately measuring small superconductive inductances is presented. The inductance to be measured is inserted into a two-junction interferometer into which control current is directly injected. The method was used to measure the penetration depth of a Pb-In-Au alloy film and the effect of magnetic field fringing into a narrow superconductive stripline.
S. Dhong, W.H. Henkels, et al.
VLSI Circuits 1989
L.D. Jackel, W.H. Henkels, et al.
Applied Physics Letters
W.H. Henkels, N.C.-C. Lu, et al.
Workshop on Low Temperature Semiconductor Electronics 1989
W.H. Henkels
Journal of Applied Physics