A supplementary bibliography of books on queueing analysis and performance evaluation

Hans Becker, Frank Schmidt, et al.

Photomask and Next-Generation Lithography Mask Technology 2004

David A. Selby

IBM J. Res. Dev

Raymond Wu, Jie Lu

ITA Conference 2007

Ruixiong Tian, Zhe Xiang, et al.

Qinghua Daxue Xuebao/Journal of Tsinghua University