A simplified scanning tunneling microscope for surface science studies

Abstract

A compact, reliable scanning tunneling microscope (STM) is described which provides atomic scale resolution and is intended for surface science studies. The novel design features consist of a rigid contact between the sample and piezoelectric scanner, together with the use of a pivot and lever arm to achieve both coarse and fine mechanical motion. Topological images of the Si(111) 7X7 surface are presented showing some point and extended defects. The bias dependence of these topographs is demonstrated and briefly discussed. © 1986, American Vacuum Society. All rights reserved.