Conference paper
Passenger-based predictive modeling of airline no-show rates
Richard D. Lawrence, Se June Hong, et al.
KDD 2003
Paper
A Simple Procedure to Generate Optimum Test Patterns for Parity Logic Networks
Abstract
A simple procedure to produce a minimum length test set for a parity network is presented. If is the largest fan in of any EX-OR gate element in the tree, 2M test patterns are chosen by considering only 2M test sequences, of length 2M, assigned to each signal line. Copyright © 1981 by The Institute of Electrical and Electronics Engineers, Inc.