David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
The running solutions and I-V characteristic of an extended Josephson junction in a state near the ohmic regime are calculated by a perturbation method. Both the voltage-driven and current-driven cases are considered and the convergence of the perturbation procedure is proved. An integral representation of the first correction, in the I-V curve, to the ohmic regime-as well as its dependence on the external magnetic field-is given and evaluated numerically for various values of the junction parameters. © 1979.
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Amir Ali Ahmadi, Raphaël M. Jungers, et al.
SICON
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000