L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
A scanning electron microscope with polarization analysis has been built using an Auger microprobe and a Mott analyser. The instrument uses a high brightness field emission source and has an analytical spatial resolution of <100nm. The instrument has a novel geometry, with the electron gun, energy analyser, and Mott analyser coaxial on a axis normal to the the sample surface. The detection plane of the Mott analyser is parallel to the in-plane magnetization of the sample surface. Spin polarized micrographs of domains at the surface of a Fe-4%Si single crystal show that, even at low magnifications, the scan related asymmetries are minor, and the interpretation of the signal contrast is straightforward. © 1990.
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Ming L. Yu
Physical Review B