A high-resolution electron microscopy investigation of some low-angle and twin boundary structures

Abstract

A number of grain boundaries prepared from evaporated Au thin films have been investigated by high-resolution electron microscopy. The dislocation configurations have been analyzed for a number of boundary plane orientations of 10° /[110] tilt boundaries and a 16° /[100] tilt boundary. A full atomic structure determination and the arrangement of close-packed polyhedra at the interface has been deduced for the (112) interface of a growth twin in Au. Observations in low-angle GaAs bicrystals clearly reveal dislocation arrangements which depend on the boundary plane and bear a close simularity to those observed in Au. © 1987.