A comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniques

Chao Wang, Sung Wook Nam, et al.

Nature Communications

J.L. Hurd, K.P. Rodbell, et al.

Applied Physics Letters

C.L. Wang, M.H. Weber, et al.

Radiation Physics and Chemistry

P.M. Mooney, G.M. Cohen, et al.

Applied Physics Letters