Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
As the semiconductor device size shrinks without a concomitant increase of numerical aperture (NA) and refractive index of the immersion fluid, printing 22-nm-technology devices presents challenges in resolution. Therefore, aggressive integration of a resolution enhancement technique (RET), design for manufacturability (DFM), and layerspecific lithographic process development are strongly required in 22-nm-technology lithography. We show patterning of an active layer of a 22-nm-node planar logic transistor device, and discuss achievements and challenges. Key issues identified include printing tight pitches, isolated trench, and 2-D features while maintaining a large lithographic process window across the chip while scaling down the cell size. Utilizing NA=1.2, printing of the static random access memory (SRAM) of a cell size of 0.1 μm2 and other critical features across the chip with a process window are demonstrated. © 2010 Society of Photo-Optical Instrumentation Engineers.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
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MRS Spring 2000
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